Microelectronics Failure Analysis

DVD 6

Lecture 16

"Electronics of Failure I"

Presenter: Chuck Hawkins

UNM

In lecture 16 Professor Hawkins defines "Reliability". He compares electronic reliability of various technologies such as vacuum tubes vs. ICs, and gives examples of companies that have gone out of business due to product reliability issues. This leads to a detailed discussion of the following topics.

Topics:

• Models, Data, and the Bathtub Curve
• Point Defects
• Electromigration
• Stress Voiding
• Test Basics: Function, Fault, Defect-Based Testing
• Speed Testing
• Stuck-at Fault Model
• IDDQ Testing
• Design for Test (DFT)
• System on a Chip (SOC)

Included with this lecture, you will receive 45 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a sample video of the presentation. The size and quality of the video have been reduced for playing on the web.

Lecture 17

"Electronics of Failure II"

Presenter: Chuck Hawkins

UNM

Lecture 17 - Chuck continues his discussion focusing on defect detection using a strategy known as "Defect-Based-Testing". This involves understanding the type of defects that are likely to occur, and developing tests that target the change in circuit behavior caused by the defect. This test approach is much different than simply verifying that the circuit is functional and meeting its data-book parameters.

Topics:

• Electronic Properties of Defects
• Defect Based Testing
• Low VDD Failure Mechanisms
• Functionality and Setup and Hold Times
• Bridge & Open Defects
• Parametric Failures
• Defect-Based Test Analysis

Included with this lecture, you will receive 40 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a sample video of the presentation. The size and quality of the video have been reduced for playing on the web.

Lecture 18

"Optoelectronic Device FA"

Presenter: Dan Barton

Sandia Labs

In lecture 18Dan explains LASER basics and provides a wealth of pictures illustrating various failure modes of optoelectronics.

Topics:

• Opto materials, devices and defects introduction
• Advanced sample preparation methods
• How FIBs make our lives easier
• Classic FA tools
• Photoluminescence
• Cathodoluminescence
• Electroluminescence
• EBIC / TEM
• Plan view vs. cross section TEM analysis
• Advanced FA tools
• TIVA and its application to Opto FA

Included with this lecture, you will receive 63 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a sample video of the presentation. The size and quality of the video have been reduced for playing on the web.

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Last modified: 09/04/08