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Microelectronics Failure AnalysisDVD 7Lecture 19 "EOS / ESD" Presenter: Chuck Hawkins UNM Professor Hawkins in back again in lecture 19, this time he discusses Electrical OverStress and Elector Static Discharge. Chuck explains EOS/ESD: what they are and how to tell the difference. Topics:
Included with this lecture, you will receive 29 presentation slides in PDF format. Lecture time is approximately 75 minutes. Lecture 20 "Advanced Fault Isolation 1: SQUID Microscopy" Presenter: Lee Knaus Neocera Corp. Lecture 20 - Lee has worked on development of the Advanced Fault Isolation Microscopy system called the Superconducting Quantum Interference Device (SQUID). Lee explains why this technology is needed and the type of defects that can be localized by its use. Topics:
Included with this lecture, you will receive 28 presentation slides in PDF format. Lecture time is approximately 75 minutes. Lecture 21 "Advanced Fault Isolation 2: SQUID Microscopy" Presenter: Lee Knaus Neocera Corp. Lecture 21 is the second half of Lee's lecture on the SQUID Microscope. Lee continues to explain how the instrument is used for current imaging and its use for failure analysis in semiconductor applications. Topics:
Included with this lecture, you will receive 44 presentation slides in PDF format. Lecture time is approximately 75 minutes. |
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