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Microelectronics Failure AnalysisDVD 8Lecture 22 "Focused Ion Beam (FIB) methods" Presenter: Joe Michael Sandia Labs In lecture 22 Joe explains the workings of Focused Ion Beam instrumentation. It's obvious that Joe has years of experience in this area and he supports his discussion with excellent pictures and graphs. Topics:
Included with this lecture, you will receive 56 presentation slides in PDF format. Lecture time is approximately 75 minutes. Lecture 23 "MEMS Failure Analysis I" Presenter:Jerry Walraven Sandia Labs Lecture 23 - Jerry explains the details of Microelectromechanical Systems (MEMS) technology. He discusses tools and techniques for MEMS failure analysis, and describes failure mechanisms observed in various MEMS technologies. Topics:
Included with this lecture, you will receive 34 presentation slides in PDF format. Lecture time is approximately 75 minutes. Lecture 24 "MEMS Failure Analysis II" Presenter:Jerry Walraven Sandia Labs In Lecture 24 Jerry explains that MEMS Failure Analysis activities fall into 3 separate categories: Structural, Chemical and Electrical. Topics:
Included with this lecture, you will receive 42 presentation slides in PDF format. Lecture time is approximately 75 minutes. |
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