DVD |
Lecture |
Topics |
Presenter |
DVD # 1 Order
DVD # 1 |
1 |
Introduction to Failure Analysis |
Rich Anderson - Sandia Labs |
| 2 |
Basic Failure Analysis Techniques I |
Chris Henderson - Semitracks, Inc. |
| 3 |
Basic Failure Analysis Techniques II |
Chris Henderson - Semitracks, Inc. |
DVD # 2 Order
DVD # 2 |
4 |
Electron Microscopy |
Larry Wagner - Texas Instruments |
| 5 |
Fault Isolation Scanning Optical Microscopy |
Ed Cole - Sandia Labs |
| 6 |
IC Packaging Technology & Analytical Methods |
Tom Moore - Omniprobe, Inc. |
DVD # 3 Order
DVD # 3 |
7 |
Decapsulation and Package Analysis |
Mike Strizich - ASI |
| 8 |
Fault Isolation Optical Techniques |
Ed Cole - Sandia Labs |
| 9 |
Atomic Force Microscopy |
Pai Tangyunyong - Sandia Labs |
DVD # 4 Order
DVD # 4 |
10 |
Deprocessing and Sample Preparation |
Mike Strizich - ASI |
| 11 |
Soft Defect Localization |
Ed Cole - Sandia Labs |
| 12 |
Advanced Fault Isolation - Thermal Imaging |
Dan Barton - Sandia Labs |
DVD # 5 Order
DVD # 5 |
13 |
Issues of Backside Sample Prep |
Dan Barton - Sandia Labs |
| 14 |
Backside Analysis Techniques |
Mike Bruce - AMD |
| 15 |
Photoemission Techniques |
Dan Barton - Sandia Labs |
DVD # 6 Order
DVD # 6 |
16 |
Electronics of Failure I |
Chuck Hawkins - UNM |
| 17 |
Electronics of Failure II |
Chuck Hawkins- UNM |
| 18 |
Optoelectronic Device FA |
Dan Barton - Sandia Labs |
DVD # 7 Order
DVD # 7 |
19 |
EOS / ESD |
Chuck Hawkins - UNM |
| 20 |
Advanced Fault Isolation 1: SQUID microscopy |
Lee Knaus - Neocera Corp. |
| 21 |
Advanced Fault Isolation 2: SQUID microscopy |
Lee Knaus - Neocera Corp. |
DVD # 8 Order
DVD # 8 |
22 |
Focused Ion Beam (FIB) methods |
Joe Michael - Sandia Labs |
| 23 |
MEMS Failure Analysis I |
Jerry Walraven - Sandia Labs |
| 24 |
MEMS Failure Analysis II |
Jerry Walraven - Sandia Labs |
DVD # 9 Order
DVD # 9 |
25 |
Failure Analysis in High Volume Manufacturing |
Kathy Clark |
| 26 |
Integrated Circuit Debug and Validation |
Lawrence Clark - UNM |
| 27 |
Elemental Analysis for FA |
Paul Kotula - Sandia Labs |
DVD # 10 Order
DVD # 10 |
28 |
Focus on Structural Test: AC Scan |
Alfred Crouch - Inovys Corp. |
| 29 |
Failure Analysis Lab Management |
Dick Ross - IBM |
| 30 |
Course Summary |
Chuck Hawkins - UNM |
