Semitracks - Semiconductor, Microelectronics, Microsystems, and Nanotechnology Training

 

Our Mission:  Education and Training for the Electronics Industry

Semitracks provides education, training, and certification services and products for the electronics industry. We specialize in serving Semiconductor, Microsystems and Nanotechnology suppliers and users.  Semitracks Inc. helps engineers, technicians, scientists, and management understand these dynamic fields. We offer courses in Semiconductor Reliability, Test, Packaging, Process Integration, Failure and Yield Analysis, and Focused Ion Beam Technology. Learn from the Experts.

We offer both public and in-house courses. We can customize our courses for your individual needs.

Can't make it to one of our multiple public classes, try our new and improved online training site, where you can learn the latest in Semiconductor Reliability, Technology, Process Integration, and Failure and Yield Analysis right from your personal computer. We also sell the manuals from select courses.


Around the Circuit - Special Semicon West Event!

Semitracks and Semiconductor International have put together a one-day course on the Reliability and Characterization Challenges for Advanced Semiconductor Devices, to be held in conjunction with Semicon West.

Click here for more information

Semitracks will be exhibiting at Semicon West which will be held at the Moscone Convention Center in San Francisco, CA, July 12-14, 2005. Our booth  is #8719 (second floor in the West Exhibit Hall).

Check out the comments from our latest course. Click Here.

Click here for the latest news about Semitracks Inc. 


Contact Information for Semitracks Inc.

Telephone
505-858-0454
FAX
505-858-9813
Postal address
5608 Brockton Court NE Albuquerque NM 87111-6625
Electronic mail
General Information: info@semitracks.com
Sales:
Customer Support:
Webmaster: webmaster@semitracks.com
 
Send mail to webmaster@semitracks.com with questions or comments about this web site.
Copyright © 2008 Semitracks
Last modified: 03/16/09