Content Overview

Sections

Failure Analysis - Die Level [+/-]

Courses
  • Chemical Unlayering [+/-]
    • Sample Preparation - Part 1
    • Sample Preparation - Part 2
    • Sample Preparation - Part 3
    • Sample Preparation - Part 4
    • Sample Preparation - Part 5
    • Sample Preparation - Part 6
    • Sample Preparation - Part 7
    • Deprocessing Quiz
  • Electron Beam Techniques [+/-]
    • Electron Beam Tools - Part 1
    • Electron Beam Tools - Part 2
    • Electron Beam Tools - Part 3
    • Electron Beam Tools - Part 4
    • Electron Beam Tools - Part 5
    • Electron Beam Techniques Quiz
  • FIB [+/-]
    • FIB Analysis
    • FIB Techniques Quiz
  • Inspection [+/-]
    • Infrared Microscopy
    • Optical Microscopy
    • Scanning Electron Microscopy
    • Optical and SEM Inspection Quiz
  • Light Emission [+/-]
    • Light Emission Microscopy - Part 1
    • Light Emission Microscopy - Part 2
    • Light Emission Microscopy - Part 3
    • Light Emission Microscopy - Part 4
    • Light Emission Microscopy - Part 5
    • Light Emission Quiz
  • Optical Beam Techniques [+/-]
    • Optical Beam Techniques - Part 1
    • Optical Beam Techniques - Part 2
    • Optical Beam Techniques - Part 3
    • Optical Beam Techniques - Part 4
    • Optical Beam Techniques - Part 5
    • Optical Beam Techniques Quiz
  • Scanned Probe Techniques [+/-]
    • Scanned Probe Techniques
    • SPM Techniques Quiz
  • Thermal Detection Techniques [+/-]
    • Thermal Detection Techniques - Part 1
    • Thermal Detection Techniques - Part 2
    • Thermal Detection Techniques - Part 3
    • Thermal Detection Techniques - Part 4
    • Thermal Detection Techniques - Part 5
    • Thermal Detection Techniques Quiz
Documents
  • Chemical Unlayering [+/-]
    • Chemical Unlayering
  • Electron Beam Techniques [+/-]
    • Electron Beam Techniques
  • FIB [+/-]
    • FIB Technology
  • Inspection [+/-]
    • Inspection
  • Light Emission [+/-]
    • Light Emission Microscopy
  • Optical Beam Techniques [+/-]
    • Optical Beam Techniques
  • Scanned Probe Techniques [+/-]
    • Scanned Probe Techniques
  • Thermal Detection Techniques [+/-]
    • Thermal Detection Techniques
Videos
  • Chemical Unlayering [+/-]
    • Passivation Removal - Reactive Ion Etch Method
  • Electron Beam Techniques [+/-]
    • Capacitive Coupled Voltage Contrast & Static Voltage Contrast
    • CIVA
    • Electron Beam Probing - Imaging, Setup, & Waveform Acquisition
    • Resistive Contrast Imaging
  • FIB
    • Circuit Editing & Cross Sectioning
  • Inspection
    • Optical Microscopy - Parts 1, 2, & 3
  • Light Emission [+/-]
    • LEM
    • PICA Microprocessor & Ring Oscillator
    • Spectral Light Emission - Part 1
    • Spectral Light Emission - Part 2
    • Spectral Light Emission - Part 3
  • Optical Beam Techniques
    • LIVA - Backside, Frontside, & SRAM Example
    • Seeback Effect Imaging
    • TIVA - Backside SRAM Short
    • TIVA - Metal-2 Metal-3 Short
  • Scanned Probe Techniques
    • Atomic Force Microscopy
    • Magnetic Force Microscopy
  • Thermal Detection Techniques
    • Fluorescent Microthermal Imaging
    • Liquid Crystal Thermography

Failure Analysis - Electrical [+/-]

Courses
  • Troubleshooting [+/-]
    • Analog Troubleshooting
    • Digital Troubleshooting
    • Memory Troubleshooting
    • Microprocessor Troubleshooting
  • Electrical Analysis [+/-]
    • Basic Circuit Electrical Behavior
    • Electrical Testing - Part 2
    • Electrical Testing - IDDQ and Test Equipment
    • Electrical Testing - Part 4
    • Software Aids
    • Quiz: Electrical Testing
Documents
  • Electrical Analysis [+/-]
    • Electrical Testing
Videos
  • Electrical Analysis
    • IDDQ Testing

Failure Analysis - Materials Characterization [+/-]

Courses
  • Materials Characterization [+/-]
    • Analytical Techniques
    • Analytical Techniques Quiz
Documents
  • Materials Characterization [+/-]
    • Analytical Techniques
Videos
  • Materials Characterization
    • TEM

Failure Analysis - Package Level [+/-]

Courses
  • Package Access [+/-]
    • Backside Sample Preparation - Part 1
    • Backside Sample Preparation - Part 2
    • Backside Sample Preparation - Part 3
    • Quiz: Package Decapsulation and Backside Sample Preparation
  • Package Inspection Techniques [+/-]
    • Package Inspection Techniques - Part 1
    • Package Inspection Techniques - Part 2
    • Package Inspection Techniques - Part 3
    • Package Inspection Techniques - Part 4
    • Package Inspection Techniques - Part 5
    • Quiz: Package Analysis Techniques
Documents
  • Package Access [+/-]
    • Decapsulation/Backside Sample Preparation
  • Package Inspection Techniques [+/-]
    • Packaging Testing
Videos
  • Package Inspection Techniques
    • CSAM Video Presentation
    • X-ray Microtomography Example
    • X-ray Nanotomography Example

Failure Analysis - Procedures

Courses
  • Gathering Information [+/-]
    • Gathering Background Information
  • Principles and Procedures [+/-]
    • Interpreting Overstress Damage
    • Principles and Procedures
    • Principles and Procedures - Part 2
    • Principles and Procedures - Part 3
    • Quiz: Principles and Procedures
Documents
  • Gathering Information [+/-]
    • Gathering Information
  • Principles and Procedures [+/-]
    • Principles and Procedures
Simulations
  • FA Case Histories [+/-]
    • Failure Analysis Case Histories

Chemistry Basics

Courses
  • Chemistry Basics Overview [+/-]
    • Balancing Chemical Equations
    • Naming Compounds
    • Limiting Reactants Experiment
    • Balancing Chemical Equations Quiz

Design [+/-]

Courses
  • Design [+/-]
    • Amplifiers and Multipliers
    • Analog Circuit Basics
    • Design Validation
    • Dynamic Analog Circuits
  • Digital Fundamentals [+/-]
    • Binary Number System
    • Basic Logic Gates
    • Basic Logic Operators and Boolean Algebra
    • Logic Functions

Failure Mechanisms [+/-]

Courses
  • Dielectric Failure Mechanisms [+/-]
    • TDDB - Introduction
    • TDDB - Oxide Breakdown Models
    • TDDB - Soft Breakdown
    • TDDB in Copper Low-K Systems
    • Time Dependent Dielectric Breakdown
    • Time Dependent Dielectric Breakdown Quiz
  • Diffusion and Bulk Defects [+/-]
    • Diffusion Alignment Defects
    • Diffusion Profile Anomalies
    • Random Diffusion Masking Defects
    • Under or Oversized Masking Features
  • Interconnect Failure Mechanisms [+/-]
    • Electromigration
    • Electromigration in Copper Low-k Systems
    • Electromigration Quiz
    • Stress Induced Voiding
    • Stress Induced Voiding - Case History
    • Stress Induced Voiding in Current Technologies
    • Stress Induced Voiding Quiz
  • Package Level Failure Mechanisms [+/-]
    • Moisture and Corrosion
    • Thermal Degradation
    • Thermomechanical Stress - Part 1
    • Thermomechanical Stress - Part 2
  • Transistor Failure Mechanisms [+/-]
    • High-K Gate Dielectric Reliability
    • Hot Carrier Degradation
    • Hot Carrier Degradation Quiz
    • Ionic Contamination
    • Negative Bias Temperature Instability
    • NBTI Quiz
  • Use Condition Failure Mechanisms [+/-]
    • Electrical Overstress and ESD
    • Interpreting Overstress Damage
    • Radiation Effects
Documents
  • Failure Mechanisms [+/-]
    • Electromigration
    • EOS/ESD
    • Hot Carrier Effects
    • Ionic Contamination
    • Moisture
    • Radiation Damage
    • Stress Induced Voiding
    • Thermal Degradation
    • Thermomechanical Stress
    • Time Dependent Dielectric Breakdown
Videos
  • Failure Mechanisms [+/-]
    • Electromigration Video
    • Stress Induced Leakage Current

MIL-STD Training

Courses
  • Pre-Cap Visual Inspection [+/-]
    • Introduction and Overview
    • Equipment for Pre-Cap Inspection

Packaging Design [+/-]

Courses
  • Courses [+/-]
    • Course and Instructor Overview
    • Packaging Engineering and the Electronics Ecosystem
    • The ITRS and Its Impact on Packaging Design and Modeling
    • JEDEC Packaging Standards
Videos
  • Videos [+/-]
    • Ceramic Dual Inline Package Animation
    • Chip Scale Package
    • Lead-On Chip Package Animation
    • MicroBGA: Lead Frame Preparation
    • MicroBGA: MF-LOC
    • MicroBGA: QFN
    • MicroBGA: Solder Bump Formation
    • MicroBGA: Terminal Formation
    • Plastic Dual Inline Package Animation
    • Solder Bump Animation

Packaging Technology [+/-]

Courses
  • Business Trends and Drivers [+/-]
    • Business Trends and Drivers
    • ITRS Roadmap
  • Lead Free Issues [+/-]
    • Lead Free Issues
  • System-on-a-Chip vs. System-in-a-Package [+/-]
    • System-on-a-Chip vs. System-in-a-Package
  • Use Conditions [+/-]
    • Use Conditions
  • Low-K Issues [+/-]
    • Low-K Issues
    • Copper Low-k Impact on Package Reliability
  • Polymers [+/-]
    • Mechanical Behavior of Solids
    • Polymer Case Studies
    • Specialty Polymers in Electronics

Photovoltaics

Courses
  • Photovoltaics Overview [+/-]
    • Outline
    • Introduction to Silicon Photovoltaics Technology
    • Properties of Sunlight
    • Semiconductor Properties
    • Solar Cell Structure
    • Design of Silicon Cells
    • Manufacturing Cells
    • Solar Cell Production Line

Processing

Courses
  • Lithography [+/-]
    • Lithography - Introduction
    • Lithography - Resolution
    • Lithography - Resists
    • Lithography - Future
  • Materials for Processing [+/-]
    • Low-K Materials
    • Etch Stop Materials for Low-K Dielectrics
  • Process Integration [+/-]
    • LOCOS and STI
    • Salicide and BEOL
    • Process Integration Quiz
  • Unit Processes [+/-]
    • Cleaning Methods
    • Chemical Mechanical Planarization
    • Deposition
    • Diffusion
    • Ion Implantation
    • Oxidation
    • Starting Material
    • Wet and Dry Etching Processes
Documents
  • Unit Processes [+/-]
    • Chemical Mechanical Polishing
    • Deposition
    • Starting Material
    • Wafer Cleaning
Videos
  • Process Integration [+/-]
    • Basic CMOS Manufacturing Process
    • Cross Section
  • Unit Processes
    • Ion Implantation Animation
    • The Zincblende Lattice

Reliability Overview [+/-]

Courses
  • Introduction to Reliability [+/-]
    • Introduction
Documents
  • Introduction to Reliability [+/-]
    • Quality and Reliability

Reliability Statistics [+/-]

Courses
  • Reliability Statistics [+/-]
    • Statistics and Distributions
    • Statistics and Distributions Quiz
    • Which Distribution Should I Use?
    • Distribution Graphing Problems
    • Lognormal Distribution Example
    • Probability of Lot Acceptance
    • Calculating Component/System Level Reliability
Documents
  • Reliability Statistics [+/-]
    • Reliability Graphing Paper
    • Standard Normal CDF Table

Reliability Testing [+/-]

Courses
  • Reliability Testing [+/-]
    • Developing Electrical Screens
    • Developing Stress Tests and Life Tests
  • Reliability Test Equipment [+/-]
    • Reliability Test Equipment - Wafer Level
    • Reliability Test Equipment - Probes
    • Reliability Test Equipment - Packaged Parts
  • Reliability Test Structures [+/-]
    • Test Structures - Basics
    • Reliability Test Structures
    • Self Stressing Test Structures
Documents
  • Reliability Testing [+/-]
    • Screens, Stress Tests, and Life Tests
  • Reliability Test Equipment [+/-]
    • Test Equipment
  • Reliability Test Structures [+/-]
    • Test Structures

Technology [+/-]

Courses
  • Interconnect Technology [+/-]
    • Interconnect Scaling Overview
  • Memory Technology [+/-]
    • Memory Technology Overview
Videos
  • Memory Technology [+/-]
    • Energy Band Transitions
    • pn Junction Diodes

Test [+/-]

Courses
  • Defect Based Testing [+/-]
    • Introduction to Defect-Oriented Testing
    • ATPG Basics
    • ATPG Algorithms
    • CMOS Defect Mechanisms and Detection Overview
    • CMOS Opens and Detection Techniques
    • CMOS Shorts and Detection Techniques
    • Defect Classes
    • Detection Techniques for CMOS Defects
    • Failure Mechanisms in CMOS IC Materials
    • Parametric Defects and Detection Techniques
  • Test Basics [+/-]
    • Automatic Testing Overview
    • Boundary Scan Overview
  • Test Methodologies [+/-]
    • Test Process Basics
    • IDDx Testing
    • Low Voltage Test
    • Timing Tests in Production
  • Fault Models [+/-]
    • Fault Models for Defect-Based Test
    • Bridging Fault Models
    • Delay Fault Models
    • Fault Diagnosis Algorithms
    • Fault Dictionaries
    • Stuck-At-Fault Testing

Yield [+/-]

Courses
  • Models [+/-]
    • Introduction to Yield Analysis
    • Advanced Yield Modeling
    • Basic Yield Models
    • Critical Area Analysis
    • Data Mining Statistics and Plotting
    • Defect Analysis and Yield Loss
  • Procedures [+/-]
    • Yield Analysis Principles and Procedures
    • Yield Enhancement Techniques - Proactive
    • Yield Enhancement Techniques - Reactive
    • Yield Methods for Low Volume Manufacturing
    • Root Cause Analysis