Semiconductor Reliability Manual
The Semiconductor Reliability Manual provides an overview of the semiconductor reliability discipline. Subjects such as electromigration, hot carrier effects, stress-induced voiding, ionic contamination, package reliability, EOS/ESD, and more are covered. The manual also covers a basic treatment of statistics for semiconductor reliability. The manual is over 600 pages and is authored by Christopher L. Henderson and Thomas M. Moore.
|Semiconductor Reliability Manual||sku-1||$495.00|
Order Form for Manuals (Printable Version)
Please note that shipping fees do not necessarily represent UPS published rates and may include handling charges levied by this store.