Optical Examination II Figures
Figure 1
Photograph of a masking defect is shown at low magnification (200X). (Courtesy Sandia Labs)
Figure 2
Photograph of a masking defect at higher magnification (1000X). (Courtesy Sandia Labs)
Figure 3
Photograph of a processing defect at higher magnification (600X). (Courtesy Sandia Labs)
Figure 4
Photograph of mechanical damage is shown at low magnification (100X). (Courtesy Sandia Labs)
Figure 5
Photograph of an epitaxial layer stacking fault is shown at low magnification (100X). (Courtesy DM Data)
Figure 6
Photograph of an epitaxial layer stacking fault at high magnification (750X). (Courtesy DM Data)
Figure 7
Photograph of a particle on a die surface after glass removal. (Courtesy Sandia Labs)
Figure 8
Photograph of a particle beneath the surface shown in Fig. 7 (before glass removal). (Courtesy Sandia Labs)
