Optical Examination II Figures

Photograph of a masking defect is shown at low magnification (200X). (Courtesy Sandia Labs)




Photograph of a masking defect at higher magnification (1000X). (Courtesy Sandia Labs)




Photograph of a processing defect at higher magnification (600X). (Courtesy Sandia Labs)




Photograph of mechanical damage is shown at low magnification (100X). (Courtesy Sandia Labs)




Photograph of an epitaxial layer stacking fault is shown at low magnification (100X). (Courtesy DM Data)




Photograph of an epitaxial layer stacking fault at high magnification (750X). (Courtesy DM Data)




Photograph of a particle on a die surface after glass removal. (Courtesy Sandia Labs)




Photograph of a particle beneath the surface shown in Fig. 7 (before glass removal). (Courtesy Sandia Labs)