Electro-Optical Probing Figures
Figure 1
Comparison of measurements made with the backside optical probe and a high-speed oscilloscope: backside optical probe (top graph) and high-speed oscilloscope (bottom graph) (after Heinrich et. al. Courtesy IBM Corp.)
Figure 2
ECL logic gate chain schematic diagram and measurement of internal gate-to-gate delays (after Heinrich et. al. Courtesy IBM Corp.)
