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The Reliability and Characterization Challenges for Advanced Semiconductor Devices Manual is a comprehensive manual that is a must for anyone interested in ultra-thin gate oxide reliability, breakdown projection, stress migration, etc. The manual contains over 100 pages of text and diagrams. When you order the manual, you also get a CD-ROM copy for quick computer reference. Authored by John S. Suehle and Ennis T. Ogawa. Pricing
Order Form for Manuals (Printable Version) Please note that shipping fees do not necessarily represent UPS published rates and may include handling charges levied by this store. |
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