Semiconductor Reliability (Online Version)

A semiconductor device is only as good as its reliability: the probability that it will perform its function under specified conditions for a set time. Today's ICs possess shorter lifetimes and reduced reliability margins, and rapid developments have led to the use of materials that are not well characterized. While reliability levels are at an all-time high level in the industry, rapid changes may lead to unintentional failures and the inability to predict when devices might fail.

Your company needs competent engineers and scientists to solve reliability problems. Semitracks' Semiconductor Reliability online training course offers detailed instruction on how to determine what failure mechanisms might occur, test for them, develop models for them, and eliminate them from the product.

Register for an Account


1-Year Online Training Subscription
(Includes this and other materials.)



Pay Via Credit Card

Add To Shopping Cart

Pay Via Purchase Order/Check

Please email the printable registration form for online training to us at the email address on the form to complete your order.

Additional Information

Refund Policy

Interested in a version of this course where you can ask questions in real time? Public and In-House versions of this course are available!

What Will I Learn By Taking This Class?

  1. Overview of Reliability and Statistics. Participants learn the fundamentals of statistics, sample sizes, distributions, and their parameters.
  2. Failure Mechanisms. Participants learn the nature and manifestation of a variety of failure mechanisms that can occur at both the die and package levels. These include time-dependent dielectric breakdown, hot carrier degradation, electromigration, stress-induced voiding, moisture, corrosion, contamination, thermomechanical effects, etc.
  3. Test Structures. Participants learn how test structures can be designed to test for a particular failure mechanism.
  4. Test Strategies. Participants learn the basics of testing test structures, conducting design screening tests, and performing burn-in testing effectively.

This course is designed for every manager, engineer, and technician concerned with reliability in the semiconductor field, using semiconductor components, or supplying tools to the industry.

Course Objectives

  1. The seminar will provide participants with an in-depth understanding of the failure mechanisms, test structures, equipment, and testing methods used to achieve today's high reliability components.
  2. Participants will be able to gather data, determine the best way to plot data, and make inferences from that data.
  3. The seminar will identify and explain how major failure mechanisms are observed, modeled, and eliminated.
  4. The seminar offers a variety of video demonstrations of analysis techniques, so the participants can get an understanding of the types of results they might expect to see with their equipment.
  5. Participants will be able to identify basic test structures and how they are used to help quantify reliability on semiconductor devices.
  6. Participants will be able to knowledgeably implement screens that are appropriate to assure the reliability of a component.
  7. Participants will be able to identify appropriate tools to purchase when starting or expanding a laboratory.