Millions of dollars wasted. Lost competitive advantage. Idle manufacturing lines and customer frustrations.
These are the all-too-common consequences of semiconductor failures. In today's economy, competent failure analysts are vital to solve these problems before their companies suffer the repercussions. However, as circuits grow more and more complicated, engineers can easily find themselves entangled in a semiconductor "labyrinth" -- searching for a microscopic failure among millions of transistors. With the wide spectrum of available analysis tools and the ever-decreasing probability of defect discovery, failure analysis can quickly become overwhelming even for the experienced analyst.
The solution: Failure and Yield Analysis, a 4-day course that covers effective analysis tools and presents systematic process flows that simplify defect localization and characterization. By focusing on a "Do it Right the First Time" approach, the class will give you the appropriate methodology to successfully locate and characterize defects to determine the root cause of failure.
October 29-November 1, 2018 | Singapore
April 23-26, 2019 | Munich, Germany
(Price available until Tues. Apr. 2)
June 3-6, 2019 | San Jose, CA, USA
(Price available until Mon. May 13)
1-Year Online Training Subscription
(Includes this and other materials.)
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Please fax the printable registration form for public courses to us at 1-866-205-0713 to complete your order.
If you would like to order additional digital manuals or order a digital manual separate from taking this course, please visit our Manuals page.
For dates and locations in South East Asia, please contact us at firstname.lastname@example.org.
If a course is canceled, refunds are limited to course registration fees. Registration within 21 days of the course is subject to $100 surcharge.
Can't attend this course in person due to work schedule or lack of travel budget? An online version of this course is available in our Online Training System! Learn more about our Online Training System.
This skill-building series is divided into three segments.
The class focuses on practical application to the situations that you face daily, whether you are a manager, an engineer, or a technician working in the semiconductor field, using semiconductor components, or supplying tools to the semiconductor industry.
Our courses are dynamic. We use a combination of instruction by lecture, problem solving, and question/answer sessions to give you the tools you need to excel in the failure analysis process. From the very first moments of the seminar until the last sentence of the training, the driving instructional factor is application. The course notes offer hundreds of pages of reference material that the participants can apply during their daily activities.
Our instructors are internationally recognized experts. Our instructors have years of current and relevant experience in their fields. They're focused on answering your questions and teaching you what you need to know.
Our analysis instructional videos help you visualize the process. Failure and Yield Analysis is a visual discipline. The ability to identify nuances and subtleties in images is critical to locating and understanding defects. Many tools output video images that must be interpreted by analysts. Our videos allow you to directly compare material you'll learn with your actual analysis work.
Christopher Henderson received his B.S. in Physics from the New Mexico Institute of Mining and Technology and his M.S.E.E. from the University of New Mexico. Chris is the President and one of the founders of Semitracks Inc., a United States-based company that provides education and semiconductor training to the electronics industry.
From 1988 to 2004, Chris worked at Sandia National Laboratories, where he was a Principal Member of Technical Staff in the Failure Analysis Department and Microsystems Partnerships Department. His job responsibilities have included failure and yield analysis of components fabricated at Sandia's Microelectronics Development Laboratory, research into the electrical behavior of defects, and consulting on microelectronics issues for the DoD. He has published over 20 papers at various conferences in semiconductor processing, reliability, failure analysis, and test. He has received two R&D 100 awards and two best paper awards. Prior to working at Sandia, Chris worked for Honeywell, BF Goodrich Aerospace, and Intel. Chris is a member of IEEE and EDFAS (the Electron Device Failure Analysis Society).
At Semitracks, Chris teaches courses on failure and yield analysis, semiconductor reliability, and other aspects of semiconductor technology.