Instructor Profile
Dr. Roger Stierman

Dr. Roger Stierman is an independent consultant who focuses on packaging issues and analysis techniques. Roger received a B.S. in Physics from Loras College and M.S. and Ph.D. degrees in Metallurgy from Iowa State University. During his 25-year career at Texas Instruments, he developed processes for semiconductor package assembly and characterized semiconductor packaging materials such as die attach, mold compounds, polymer overcoats, wire bond and flip chip connections, flip chip underfills, and package-to-PWB attachment. As manager of the Semiconductor Packaging Lab, he delivered training for physical failure analysis methods including precision cross-sectioning, SEM/EDS, X-Ray, tensile and 4-point bend testing, microhardness, RIE/ICP etching, ion milling and laser decapsulation. Currently, he is a consultant on semiconductor packaging failure analysis for Omniprobe, Inc.