System Maintenance occurs every Friday.

EOS in Manufacturing

Electrical Overstress (EOS) and Electrostatic Discharge (ESD) account for most of the electrical failures of devices that occur in factories and in the field. The effects of ESD on integrated circuits have received much attention in technical literature, standards bodies and educational workshops and tutorials. The problem has been approached in a systematic manner which has resulted in relatively successful practices for design of robust devices and control procedures for the factory. However, the same cannot be said for the effects of the broader categories of electrical stresses generally referred to as electrical overstress (EOS). This disparity is reflected in the typical Pareto analysis of failures in electrical assembly where EOS is often the most commonly assigned cause of failure and may exceed the incidence of ESD by 10 times or more. One of the main reasons for this is that EOS sources are widely varied and very application dependent. As a result, no simple broad models for EOS have emerged comparable to HBM and CDM for ESD. Common device design practices have not been developed to the same extent, system level approaches tend to be ad hoc and responsibility for controlling potential sources in manufacturing tends to be diffused or non-existent.

Although EOS and ESD damage can at times look quite similar to each other, the source of each and the solution can be quite different. Therefore, it is important to be able to distinguish between the two mechanisms. The semiconductor industry needs knowledgeable engineers and scientists to understand these issues.

EOS and ESD - Different Source - Different Solutions is a 1-hour webinar that introduces EOS, ESD, their sources, and how to distinguish between them. Emphasis is given to the less well-known aspects of EOS caused by overvoltage or overcurrent. This webinar is designed for every manager, engineer, and technician concerned with EOS/ESD on the manufacturing floor, analyzing field returns, determining impact, and developing mitigation techniques.

Register for this Course

Course Dates | Location

Request a date for this 1-hour webinar.



Pay Via Credit Card

Add To Shopping Cart

Pay Via Purchase Order/Check

Please note: If you or your company plan to pay by wire transfer, you will be charged a wire transfer fee of USD 45.00.

Please email the printable registration form for public courses to us at the email address on the form to complete your order.

Additional Information

If you have any questions concerning this course, please contact us at

Refund Policy

If a course is canceled, refunds are limited to course registration fees. Registration within 21 days of the course is subject to $100 surcharge.

What Will I Learn By Taking This Webinar?

Participants will be introduced to the following concepts:

  1. Overview of the EOS/ESD Failure Mechanisms.
  2. How to Differentiate between EOS and ESD.
  3. Sources and Causes of EOS and EOS-like ESD.
  4. Identifying and Resolving EOS/ESD on the Manufacturing Floor.


The webinar will be given by two recognized experts in the field. Terry Welsher has more than 30 years experience with EOS/ESD issues in manufacturing and product design for reliability; Chris Henderson has more than 25 years analyzing manufacturing and field returns for both EOS and ESD-related problems.