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Today’s semiconductor manufacturing lines require a level of precision that is unlike any other manufacturing process in the world. In order to make millions of state-of-the-art ICs exactly alike, one requires an extreme level of process control. One slight variation in any of the millions of inputs to the process can impact yield and/or performance. This is made even more complex by the tremendous amount of data produced by fab tools and test systems. Engineers need to understand process control in order to monitor and prevent these problems from occurring. This requires not only knowledge of the process, but also problem solving, statistics, and methods to identify issues. Design of Experiments Overview is a course that offers an overview on the methods, statistics, as well as the overall flow for developing a Design of Experiments (DOE) in a modern manufacturing environment. This course is designed for every manager, engineer, and technician working in the semiconductor field, using semiconductor components or supplying tools to the industry.
(Includes this and other materials.)
Please email the printable registration form for online training to us at the email address on the form to complete your order.
By focusing on tried and true methods for DOE, participants will learn the appropriate methodology to successfully identify problems, characterize them, and determine the root cause of failure.
Participants learn to develop the skills to determine what tools and techniques should be applied, and when they should be applied. This skill-building series covers these aspects: