Successful semiconductor manufacturing is predicated on process control. One cannot control what one does not measure, so measuring and characterizing the process is crucial to the success of the overall manufacturing endeavor. Much of the manufacturing process can be characterized through the use of statistics, since many processes will follow defined statistical patterns and models. This classroom covers the main topics related to statistics and statistical process control for semiconductor manufacturing.
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In this course we discuss the fundamentals of statistics. We cover the various distribution used in manufacturing, along with confidence and prediction intervals, and methods for controlling a process through the use of control charts.
Control Chart Basics
Confidence and Prediction Intervals