System Maintenance occurs every Friday.
System Maintenance occurs every Friday.
This workspace covers semiconductor and integrated circuit test. Test is a critical aspect of the design and manufacturing process. Test allows one to determine if the device is working correctly, and it can also give insight into potential failure mechanisms and manufacturing issues. In this section we cover: defect modeling, design for test, digital testing, analog testing, parametric testing, and test hardware.
$700
Please email the printable registration form for online training to us at the email address on the form to complete your order.
Defect-based testing is the practice of testing with the idea of detecting defective conditions on complex ICs. Defect-based testing moves beyond functional and structural testing by introducing test concepts to catch actual defects. Many defects are not easily caught with standard test techniques, and require additional test approaches. Defect-based testing incorporates knowledge of defects like opens, shorts, resistive connections, parametric anomalies, and process variation-induced problems. It requires an understanding of the electrical behavior of these defects. The electrical behavior can be turned into a defect model, which in turn leads to effective test approaches like at-speed testing, delay testing, IDDQ testing and low voltage testing. These are test strategies that are used in conjunction with standard functional and structural test. These test approaches also require an understanding of automatic test pattern generation (ATPG), since one must generate vector sets to catch these problems. Defect-based testing also is critical for failure analysis troubleshooting activities. Defect diagnosis uses these concepts and test techniques to help automatically detect defects.
Introduction to Defect-Oriented Testing
ATPG Basics
ATPG Algorithms
Basic ATPG Diagnosis
CMOS Defect Mechanisms and Detection Overview
CMOS Opens and Detection Techniques
CMOS Shorts and Detection Techniques
Defect Classes
Detection Techniques for CMOS Defects
Failure Mechanisms in CMOS IC Materials
Parametric Defects and Detection Techniques
Introduction to Defect-Oriented Testing
ATPG Basics
Basic ATPG Diagnosis
CMOS Defect Mechanisms and Detection Overview
CMOS Opens and Detection Techniques
Detection Techniques for CMOS Defects
Failure Mechanisms in CMOS IC Materials
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This material covers basic issues in test. Currently, this course contains an introduction to automatic test and an overview of boundary scan test techniques.
Automatic Testing Overview
Boundary Scan Overview
Test Engineering Overview
Test Engineering Equipment
Analog Design for Test - Overview
Continuity Testing
Current Testing
Leakage Testing
Digital Design for Test
Loadboard Hardware Components
Loadboard Hardware Design Flow
Test Economics
Automatic Testing Overview
Boundary Scan Overview
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This course material covers test methodologies for ICs. It includes information on digital testing, current testing, and timing tests. All three are useful to help localize defects and other problems on circuits prior to shipping them to the customer.
Test Process Basics
IDDx Testing
Low Voltage Test
Timing Tests in Production
Low Voltage Test
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Design For Test, also known as DFT, encompasses a set of activities that designers normally do to help aid in the testing of ICs. Complex circuits can be quite difficult to test in a thorough manner, so engineers plan for the testing by designing the circuit in such a way so that the test engineers can achieve high test coverage with minimal test costs. DFT encompasses activities like design partitioning, the use of testable technologies, like low power static CMOS, the inclusion of scan circuits, the use of built-in self test or BIST, and other aids.
Analog Design for Test - Overview
Analog DFT - Test Modes
Analog DFT - Other Methods
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This course material covers fault models that are used by engineers to develop test routines for complex chips. A fault model is an abstract concept designed to translate the behavior of a defect into a condition that can be tested, preferably on a digital test system.
Fault Models for Defect-Based Test
Bridging Fault Models
Delay Fault Models
Fault Diagnosis Algorithms
Fault Dictionaries
Stuck-At-Fault Testing
Fault Models for Defect-Based Test
Delay Fault Models
Stuck-At-Fault Testing
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