System Maintenance occurs every Friday.

EOS ESD and How to Differentiate

Electrical Overstress (EOS) and Electrostatic Discharge (ESD) account for most of the field failures observed in the electronics industry.  Although EOS and ESD damage can at times look quite similar to each other, the source each and the solution can be quite different.  Therefore, it is important to be able to distinguish between the two mechanisms.  The semiconductor industry needs knowledgeable engineers and scientists to understand these issues. EOS, ESD and How to Differentiate is a 12 hour course that offers detailed instruction on EOS, ESD and how to distinguish between them. This course is designed for every manager, engineer, and technician concerned with EOS, ESD, analyzing field returns, determining impact, and developing mitigation techniques.

Register for an Account

Item

1-Year Online Training Subscription

(Includes this and other materials.)

Cost

$700

Pay Via Credit Card

Add To Shopping Cart

Pay Via Purchase Order/Check

Please email the printable registration form for online training to us at the email address on the form to complete your order.

Additional Information

Refund Policy

What Will I Learn By Taking This Class?

Participants will learn to develop the skills to determine what constitutes good EOS and ESD design, how to recognize devices that can reduce EOS and ESD susceptibility, and how to design new EOS and ESD structures for a variety of technologies.  This skill-building series is divided into five segments:

  1. Overview of the EOS Failure Mechanism. Participants will learn the fundamentals of EOS, the physics behind overstress conditions, sources of EOS, test equipment, and the results of failure.
  2. Overview of the ESD Failure Mechanism. Participants will learn the fundamentals of ESD, the physics behind static generation and discharge, test equipment, test protocols, and the results of failure.
  3. ESD Circuit Design Issues. Participants will learn how designers develop circuits to protect against ESD damage. This includes MOSFETs, diodes, off-chip driver circuits, receiver circuits, and power clamps.
  4. How to Differentiate. Participants will learn how to tell the difference between EOS and ESD. They will learn how to simulate damage and interpret pulse widths, amplitudes and polarity.
  5. Resolving EOS and ESD on the Manufacturing Floor. Participants will see a number of common problems and their origins.

Course Objectives

  1. This course will provide participants with an in-depth understanding of electrical overstress, the models used for EOS, and the manifestation of the mechanism.
  2. Participants will be able to understand the ESD failure mechanism, test structures, equipment, and testing methods used to achieve robust ESD resistance in today’s components.
  3. This course will identify the major issues associated with ESD, explain how they occur, how they are modeled, and how they are mitigated.
  4. Participants will be able to identify basic ESD structures and how they are used to help reduce ESD susceptibility on semiconductor devices.
  5. Participants will be able to distinguish between EOS and ESD when performing a failure analysis.
  6. Participants will be able to estimate a pulse width, pulse amplitude, and determine the polarity of an EOS or ESD event.
  7. Participants will see examples of common problems that result in EOS and ESD in the manufacturing environment.

Course Contents

EOS, ESD, and How to Differentiate

  • Announcements

Courses

  • EOS, ESD, and How to Differentiate - Outline and Introduction
  • EOS Overview
  • Latch-Up Overview
  • Snapback Overview
  • ESD Overview
  • ESD Protection Strategies
  • Overstress in Manufacturing - Charge Based Examples
  • Overstress in Manufacturing - Non Charge Based Examples
  • Overstress in Manufacturing - Measurement and Detection
  • Failure Analysis Techniques
  • Interpreting Overstress Damage
  • Methods to Prevent Electrical Overstress
  • Standards Associated with EOS/ESD
  • Final Test: EOS ESD and How to Differentiate
  • EOS ESD and How to Differentiate - Completion Certificate

Documents

  • EOS, ESD, and How to Differentiate - Outline and Introduction
  • EOS Overview
  • Latch-Up Overview
  • Snapback Overview
  • ESD Overview
  • ESD Protection Strategies
  • Overstress in Manufacturing - Charge Based Examples
  • Overstress in Manufacturing - Non Charge Based Examples
  • Overstress in Manufacturing - Measurement and Detection
  • Failure Analysis Techniques
  • Interpreting Overstress Damage
  • Methods to Prevent Electrical Overstress
  • Standards Associated with EOS and ESD

Videos

  • Soldering Station Case Study