System Maintenance occurs every Friday.
System Maintenance occurs every Friday.
The focused ion beam (FIB) system has become an indispensable tool for failure analysis, design debug, and circuit editing. The FIB allows one to make modifications to a circuit and test them before generating new masks for a chip design. This can save millions of dollars in mask and wafer processing costs. The FIB is also used for TEM sample preparation, cross-sectioning, and other types of micromachining activities.
$700
Please email the printable registration form for online training to us at the email address on the form to complete your order.