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Acoustic Microscopy

Scanning Acoustic Microscopy is an important technique used in failure analysis and quality inspection of semiconductor components. Scanning Acoustic Microscopy or (SAM), uses sound waves and their interactions with materials and materials interfaces to produce a waveform or image of the internal construction non-destructively. SAM primarily detects changes at interfaces, so these features are the primary ones in the image or waveform. Engineers use SAM to identify cracks, delaminations, voids, and placement of structures in complex packages.

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Course Contents

Acoustic Microscopy

  • Announcements

Courses

  • SAM - Equipment
  • SAM - Equipment Quiz
  • SAM - Imaging Modes
  • SAM - Imaging Modes Quiz
  • SAM - Interpretation
  • SAM - Interpretation Quiz
  • SAM - Physics of Operation
  • SAM - Physics of Operation Quiz
  • Quiz: Acoustic Microscopy

Acoustic Microscopy Final Test

  • Acoustic Microscopy Final Test

Certificate

  • Acoustic Microscopy Certificaate

Videos

  • Acoustic Microscopy