Materials Characterization

Materials Characterization is an integral aspect of the semiconductor research, development, production and returns analysis process. There are many dozens of materials characterization techniques used on semiconductor and electronic components. In this course, we will cover some of the more commonly used techniques. This includes techniques such as:

Auger Electron Spectroscopy (AES)
Electron Energy Loss Spectroscopy (EELS)
Energy Dispersive X-Ray Spectroscopy (EDS or EDX)
Scanning Electron Microscopy (SEM)
Scanning Transmission Electron Microscopy (STEM)
Secondary Ion Mass Spectroscopy (SIMS)
Transmission Electron Microscopy (TEM)
X-Ray Diffraction (XRF)
X-Ray Photoelectron Spectroscopy (XPS)
and others.

Register for an Account

Item

1-Year Online Training Subscription

(Includes this and other materials.)

Cost

$700

Pay Via Credit Card

Add To Shopping Cart

Pay Via Purchase Order/Check

Please email the printable registration form for online training to us at the email address on the form to complete your order.

Additional Information

Refund Policy

Interested in courses where you can ask questions in real time? Public and In-House courses are available!

Course Contents

Materials Characterization

Announcements

Courses

Scanning Transmission Electron Microscopy (STEM)

Scanning Transmission Electron Microscopy (STEM) Quiz

Transmission Electron Microscopy (TEM)

Transmission Electron Microscopy (TEM) Quiz

Electron Energy Loss Spectroscopy (EELS)

Electron Energy Loss Spectroscopy (EELS) Quiz

X-Ray Diffraction (XRD)

X-Ray Diffraction (XRD) Quiz

X-Ray Photoelectron Spectroscopy (XPS)

X-Ray Photoelectron Spectroscopy (XPS) Quiz

Auger Electron Spectroscopy (AES)

Auger Electron Spectroscopy (AES) Quiz

Secondary Ion Mass Spectroscopy (SIMS)

Secondary Ion Mass Spectroscopy (SIMS) Quiz

Time-Of-Flight Secondary Ion Mass Spectroscopy

Time-Of-Flight Secondary Ion Mass Spectroscopy Quiz

Electron Backscatter Diffraction

Electron Backscatter Diffraction Quiz

Energy-Dispersive X-Ray Spectroscopy

Energy-Dispersive X-Ray Spectroscopy Quiz

Final Test

Materials Characterization Final Test

Certificate

Materials Characterization Certificate

Documents

Analytical Techniques - Basic

Secondary Ion Mass Spectroscopy

Analytical Techniques - Advanced

Analytical Techniques - Imaging

Time-Of-Flight Secondary Ion Mass Spectroscopy

Electron Backscatter Diffraction

Electron Energy Loss Spectroscopy

Auger Electron Spectroscopy

Energy-Dispersive X-Ray Spectroscopy

Videos

TEM - Electron Beam Diffraction

TEM - Energy Dispersive X-Ray Spectroscopy

TEM - Imaging

TEM - Sample Preparation

Energy Dispersive X-Ray Spectroscopy