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Materials Characterization

Materials Characterization is an integral aspect of the semiconductor research, development, production and returns analysis process.  There are many dozens of materials characterization techniques used on semiconductor and electronic components.  In this course, we will cover some of the more commonly used techniques.  This includes techniques such as:
  • Auger Electron Spectroscopy (AES)  
  • Electron Energy Loss Spectroscopy (EELS)
  • Energy Dispersive X-Ray Spectroscopy (EDS or EDX)
  • Scanning Electron Microscopy (SEM)
  • Scanning Transmission Electron Microscopy (STEM)
  • Secondary Ion Mass Spectroscopy (SIMS)
  • Transmission Electron Microscopy (TEM)
  • X-Ray Diffraction (XRF)
  • X-Ray Photoelectron Spectroscopy (XPS)
  • and others.

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1-Year Online Training Subscription

(Includes this and other materials.)

Cost

$700

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Additional Information

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Interested in courses where you can ask questions in real time? Public and In-House courses are available!

Course Contents

Materials Characterization

  • Announcements

Courses

  • Scanning Transmission Electron Microscopy (STEM)
  • Scanning Transmission Electron Microscopy (STEM) Quiz
  • Transmission Electron Microscopy (TEM)
  • Transmission Electron Microscopy (TEM) Quiz
  • Electron Energy Loss Spectroscopy (EELS)
  • Electron Energy Loss Spectroscopy (EELS) Quiz
  • X-Ray Diffraction (XRD)
  • X-Ray Diffraction (XRD) Quiz
  • X-Ray Photoelectron Spectroscopy (XPS)
  • X-Ray Photoelectron Spectroscopy (XPS) Quiz
  • Auger Electron Spectroscopy (AES)
  • Auger Electron Spectroscopy (AES) Quiz
  • Secondary Ion Mass Spectroscopy (SIMS)
  • Secondary Ion Mass Spectroscopy (SIMS) Quiz
  • Time-Of-Flight Secondary Ion Mass Spectroscopy
  • Time-Of-Flight Secondary Ion Mass Spectroscopy Quiz
  • Electron Backscatter Diffraction
  • Electron Backscatter Diffraction Quiz
  • Energy-Dispersive X-Ray Spectroscopy
  • Energy-Dispersive X-Ray Spectroscopy Quiz

Final Test

  • Materials Characterization Final Test

Certificate

  • Materials Characterization Certificate

Documents

  • Analytical Techniques - Basic
  • Secondary Ion Mass Spectroscopy
  • Analytical Techniques - Advanced
  • Analytical Techniques - Imaging
  • Time-Of-Flight Secondary Ion Mass Spectroscopy
  • Electron Backscatter Diffraction
  • Electron Energy Loss Spectroscopy
  • Auger Electron Spectroscopy
  • Energy-Dispersive X-Ray Spectroscopy

Videos

  • TEM - Electron Beam Diffraction
  • TEM - Energy Dispersive X-Ray Spectroscopy
  • TEM - Imaging
  • TEM - Sample Preparation
  • Energy Dispersive X-Ray Spectroscopy