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Semiconductor Testing Overview

This course provides an overview of semiconductor testing, covering the entire process from initial wafer probe to final packaged part testing. We'll begin with an introduction to the fundamental concepts of testing and then delve into specific areas like parametric testing, wafer probe equipment, and package part testing methodologies. You'll gain a thorough understanding of Automatic Test Equipment (ATE), including the equipment used for wafer probing and the intricacies of probe cards. The course also covers electrical testing principles, with a special focus on power device testing. Finally, we'll explore methods for analyzing test data and discuss the critical considerations surrounding the cost of test in semiconductor manufacturing.

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Item

1-Year Online Training Subscription

(Includes this and other materials.)

Cost

$700

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Please email the printable registration form for online training to us at the email address on the form to complete your order.

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Interested in courses where you can ask questions in real time? Public and In-House courses are available!

Course Contents

Semiconductor Testing Overview

  • Announcements

Presentations

  • Introduction
  • Parametric Testing
  • Wafer Probe
  • Packaged Part Testing
  • Automatic Test Equipment
  • Wafer Probe Equipment
  • Probe Cards
  • Electrical Testing
  • Power Device Testing
  • Analyzing Test Data
  • Cost of Test

Final Test

  • Semiconductor Testing Overview Testing

Cetificate

  • Semiconductor Testing Overview Certificate